Download PDF by D. Shindo, T. Oikawa, Daisuke Shindo, Tetsuo Oikawa: Analytical Electron Microscopy for Materials Science

By D. Shindo, T. Oikawa, Daisuke Shindo, Tetsuo Oikawa

ISBN-10: 4431669884

ISBN-13: 9784431669883

ISBN-10: 4431703365

ISBN-13: 9784431703365

Analytical electron microscopy is likely one of the strongest instruments this present day for characterization of the complicated fabrics that aid the nanotechnology of the twenty-first century. during this ebook the authors sincerely clarify either the elemental rules and the most recent advancements within the box. as well as a basic description of the inelastic scattering method, a proof of the constituent is equipped. regular quantitative analytical suggestions utilizing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy also are defined, in addition to elemental mapping recommendations. incorporated are sections on convergent beam electron diffraction and electron holography using the sphere emission gun. With beneficiant use of illustrations and experimental information, this booklet is a useful source for somebody keen on fabrics characterization, electron microscopy, fabrics technological know-how, crystallography, and instrumentation.

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By D. Shindo, T. Oikawa, Daisuke Shindo, Tetsuo Oikawa

ISBN-10: 4431669884

ISBN-13: 9784431669883

ISBN-10: 4431703365

ISBN-13: 9784431703365

Analytical electron microscopy is likely one of the strongest instruments this present day for characterization of the complicated fabrics that aid the nanotechnology of the twenty-first century. during this ebook the authors sincerely clarify either the elemental rules and the most recent advancements within the box. as well as a basic description of the inelastic scattering method, a proof of the constituent is equipped. regular quantitative analytical suggestions utilizing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy also are defined, in addition to elemental mapping recommendations. incorporated are sections on convergent beam electron diffraction and electron holography using the sphere emission gun. With beneficiant use of illustrations and experimental information, this booklet is a useful source for somebody keen on fabrics characterization, electron microscopy, fabrics technological know-how, crystallography, and instrumentation.

Show description

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Extra resources for Analytical Electron Microscopy for Materials Science

Example text

Thus, it is seen that the energy-loss processes of items 2 and 4 in the above list provide sharp peaks in a spectrum. From their energy values and intensity distribution, the elements can be identified and their composition determined. Although process 3 (see list, above) does not provide definite peaks, it affects the spectrum in the low enegy-loss region strongly, and its information can be obtained accurately through analysis of the spectrum (see Sect. 4). On the other hand, the signal of phonon excitation (item 1) is difficult to detect with a conventional spectrometer that has an energy resolution of about 1 e V.

Cross seetion of the imaging plate (FDLUR-V) showing its eonstituent parts. P EN, polyethylene naphthalate 4 104 C jg ~ 5 10 5 102 - 10-15 ~ '0 Cö ü 2 li o Photo-film 10 ' 1~ ~ 'Üj 3 10-14 10- 1:; 10-12 10-11 10-10 0 10-9 Ineident electron intensity (C/cm 2 ) Fig. 26. -"/':;'-'A Read out the signal with laser beam Fig. 25. Prineiples of reeording, reading, and erasing proeesses on the imaging plate Erase the remaining signal with light 32 2. Constitution and Basic Operation of Analytical EM Fig.

To obtain more accuracy, the camera length should be calibrated with the diffraction spots of a standard specimen whose lattice spacing is known, by recording the diffraction pattern of a specimen in the same condition as the standard. , evaporated gold particles). Note that an instrument with the capability of high-resolution diffraction without the lens is commercially available. 20 shows a relation between the spread of diffraction spots and the convergence angle of the incident electron beam.

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Analytical Electron Microscopy for Materials Science by D. Shindo, T. Oikawa, Daisuke Shindo, Tetsuo Oikawa


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